Abstract：In order to improve the accuracy of planar array capacitance imaging, an imaging algorithm based on fuzzy C-means algorithm(FCM) data optimization is proposed. According to the characteristics of capacitance data of planar array electrodes, in order to reduce the influence of capacitance measurement error on dielectric constant, application of FCM algorithm to the continuous convergence of measured capacitance to achieve data optimization. On this basis, a defect detection experiment was carried out on a kind of insulating material adhesive layer, and the image correlation coefficient of the reconstructed image was improved, and the image reconstruction error was reduced. The experimental results show that the proposed optimization algorithm can obtain more stable and effective capacitance data, and the reconstruction accuracy of glue layer defect image has been greatly improved.
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2020, Vol. 41 
