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67 GHz微波探针散射参数校准及不确定度评定方法研究
霍晔, 王一帮, 刘晨, 吴爱华, 栾鹏, 王浩, 张立飞
计量学报 ›› 2026, Vol. 47 ›› Issue (2) : 251-255.
PDF(998 KB)
PDF(998 KB)
67 GHz微波探针散射参数校准及不确定度评定方法研究
Research on Calibration and Uncertainty Evaluation Method of Scattering Parameters for 67 GHz Microwave Probes
提出了一种67 GHz微波探针散射参数校准及不确定度评定的方法。建立了微波探针测量模型,通过在片开路校准件、短路校准件、负载校准件散射参数的测量值和定义值,计算得到微波探针散射参数校准值。分析了不确定度来源,用蒙特卡洛方法评定了测量不确定度。进行了试验分析,在100 MHz ~ 67 GHz频段范围内,S 11和S 22校准值优于-15 dB,S 21校准值优于-1 dB,均符合说明书技术指标,验证了方法的正确性。该方法为微波探针是否满足测试要求提供量化依据。
A method for calibrating scattering parameters and evaluating uncertainty of 67 GHz microwave probe is proposed. A microwave probe measurement model is established, and the calibration values of microwave probe scattering parameters are calculated by measuring and defining the scattering parameters of the on-wafer open calibration standard, short calibration standard and load calibration standard. The source of uncertainty is analyzed and the measurement uncertainty is evaluated by Monte Carlo method. The experimental analysis is carried out, and in the range of 100 MHz~67 GHz, the S 11 and S 22 are better than -15 dB, and the S 21 is better than -1 dB, which meets the technical specifications, and the correctness of the method is verified. The calibration method in this study provides quantitative basis for whether the microwave probes meet the test requirement.
无线电计量 / 微波探针 / 在片散射参数 / 校准 / 不确定度
electronic metrology / microwave probe / on-wafer scattering parameters / calibration / uncertainty
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