AFM线宽测量不确定度的分析与评定

韩国强,陈玉琴

计量学报 ›› 2012, Vol. 33 ›› Issue (6) : 486-489.

PDF(871 KB)
PDF(871 KB)
计量学报 ›› 2012, Vol. 33 ›› Issue (6) : 486-489. DOI: 10.3969/j.issn.1000-1158.2012.06.02

AFM线宽测量不确定度的分析与评定

  • 韩国强1,2,3,陈玉琴1
作者信息 +

Analysis and Evaluation of AFM Uncertainty in Linewidth Measurement

  • HAN Guo-qiang1,2,3,CHEN Yu-qin1
Author information +
文章历史 +

摘要

详细分析了P47型原子力显微镜线宽测量不确定度的来源,给出了基于几何形状的线宽测量模型,提出了线宽测量不确定度的评定路线和方法。确定了探针针尖引起的测量不确定度是AFM线宽测量不确定度的主要来源,并对其进行了定量分析。普通Si3N4探针针尖引起的不确定度分量约占线宽总量的5%。

Abstract

The sources of linewidth measurement uncertainty of AFM type P47 are analyzed in details.A new model based on geometry shape of linewidth measurement is proposed.An uncertainty evaluation method is offered according to systematic analysis results in linewidth measurement.The measurement uncertainty component caused by traditional Si3N4AFM tip is about 5% of the total linewidth.Finally,the main measurement uncertainty source- AFM tip is determined.

关键词

计量学 / 原子力显微镜 / 线宽 / 测量不确定度

Key words

Metrology / Atomic force microscopy(AFM) / Linewidth / Measurement uncertainty

引用本文

导出引用
韩国强,陈玉琴. AFM线宽测量不确定度的分析与评定[J]. 计量学报. 2012, 33(6): 486-489 https://doi.org/10.3969/j.issn.1000-1158.2012.06.02
HAN Guo-qiang,CHEN Yu-qin. Analysis and Evaluation of AFM Uncertainty in Linewidth Measurement[J]. Acta Metrologica Sinica. 2012, 33(6): 486-489 https://doi.org/10.3969/j.issn.1000-1158.2012.06.02
中图分类号: TB92   

参考文献

[1]The Semiconductor Industry Association.International Roadmap for Semiconductors(ITRS)[EB].http://www.itrs.net/Links/2007ITRS/2007_Chapters/2007_Metrology.pdf,2007
[2]Misumi I, G onda, Kurosawa T, et al.  Uncertainty in pitch measurements of one-dimensional grating standards using a nanometrological atomic force microscopy[J].Measurement Science and Technology,2003,14(4):463-471.
[3]褚魏,赵学增,王凌,等.使用AFM测量纳米尺度线宽的不确定度分析[J].计量学报,2005,26(2):6-10.
[4]朱明智,蒋庄德,景蔚萱.原子力显微镜探针原位有效参数对线宽测量的修正[J].计量学报,2005,26(3):204-206,252.
[5]韩国强,景蔚萱,蒋庄德,等.利用Si(100)典型微结构对原子力显微镜探针参数进行表征[J].计量学报, 2010, 5(31):426-429.
[6]International Organization for Standardization,Guide to the expression of uncertainty in measurement[S].1995.
[7]Taylor B N, Kuyatt C E.  Guidelines for evaluating and expressing the uncertainty of NIST measurment results[EB]. http://www.nist.gov/physlab/pubs/tn1297/,1994
[8]Zhang H, Huang F, Higuchi T.  Dual unit scanning tunneling microscope atomic force microscopy for length measurement based on reference scales[J].Journal of Vacuum Science and Technology B, 1997,15(4)780-784.
[9]Yurov V Y, Klimov A N.  Scanning tunneling microscope calibration and reconstruction of real image-drift and slope elimination[J].Review of Scientific Instruments, 1994,65(5):1551-1557.
[10]Mativetsky J M, Burke S A,Hoffmann R, et al.  Molecular resolution imaging of C-60 on Au(111) by non-contact atomic force microscopy[J].  Nanotechnology, 2004, 15(2):40-43.
[11]Lapshin R V, Rostislav V. Automatic drift elimination in probe microscope images based on techniques of counter-scanning and topography feature recognition[J].Measurement Science and Technology, 2007, 18(3):907-927.

基金

国家自然科学基金(90923001);福建省教育厅项目(JA11031);福州大学人才基金(022319)

PDF(871 KB)

Accesses

Citation

Detail

段落导航
相关文章

/